Record link: 
http://hdl.handle.net/20.500.12708/77784
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Title: 
A new approach in valence EELS: using slow electrons for optical characterization
en
Citation: 
Stöger-Pollach, M. (2009). A new approach in valence EELS: using slow electrons for optical characterization. In G. Kothleitner, M. Leisch, M. A. Pabst, G. Zellnig, W. Grogger, F. Hofer, & P. Pölt (Eds.), Mc 2009. Microscopy Conference, Graz, Austria. 30 August - 4 September 2009. First Joint Meeting Of Dreiländertagung And Multinational Congress On Microscopy. (p. 2). Facultas Verlag. https://doi.org/10.3217/978-3-85125-062-6-055
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Publisher DOI: 
10.3217/978-3-85125-062-6-055
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Language: 
English
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Authors: 
Stöger-Pollach, Michael 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
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Published in: 
Mc 2009. Microscopy Conference, Graz, Austria. 30 August - 4 September 2009. First Joint Meeting Of Dreiländertagung And Multinational Congress On Microscopy. 
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ISBN: 
978-3-85125-062-6
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DOI of the book: 
10.3217/978-3-85125-062-6
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Date (published): 
2009
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Event name: 
Microscopy Conference Graz, Dreiländertagung 
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Event date: 
30-Aug-2009 - 4-Sep-2009
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Event place: 
Graz, Austria
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Number of Pages: 
2
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Publisher: 
Facultas Verlag
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Publisher: 
Verlag der Technischen Universität Graz, Graz
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Keywords: 
Valence EELS; delocalization; dielectric function; interface plasmon
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Science Branch: 
Physik, Mechanik, Astronomie
Chemie
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Appears in Collections:
Conference Paper

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