<div class="csl-bib-body">
<div class="csl-entry">Schwab, S. (2017). <i>Ion diffusion and migration in semiconductor passivation and encapsulation materials</i> [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/79615</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/79615
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dc.format
VIII, 98 Blätter
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dc.language
English
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dc.language.iso
en
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dc.subject
Ionendiffusion
de
dc.subject
Ionenmigration
de
dc.subject
Halbleiter
de
dc.subject
Transistoren
de
dc.subject
Zuverlässigkeit
de
dc.subject
Analytik
de
dc.subject
TOF-SIMS
de
dc.subject
Ion diffusion
en
dc.subject
Ion migration
en
dc.subject
Ion mobility
en
dc.subject
Semiconductor
en
dc.subject
Reliability
en
dc.subject
Analytics
en
dc.subject
TOF-SIMS
en
dc.title
Ion diffusion and migration in semiconductor passivation and encapsulation materials
en
dc.type
Thesis
en
dc.type
Hochschulschrift
de
dc.contributor.affiliation
TU Wien, Österreich
-
dc.publisher.place
Wien
-
tuw.thesisinformation
Technische Universität Wien
-
tuw.publication.orgunit
E164 - Institut für Chemische Technologien und Analytik
-
dc.type.qualificationlevel
Doctoral
-
dc.identifier.libraryid
AC14479160
-
dc.description.numberOfPages
98
-
dc.thesistype
Dissertation
de
dc.thesistype
Dissertation
en
tuw.advisor.staffStatus
staff
-
item.languageiso639-1
en
-
item.openairetype
doctoral thesis
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_db06
-
crisitem.author.dept
E164 - Institut für Chemische Technologien und Analytik
