<div class="csl-bib-body">
<div class="csl-entry">Huber, T. M., Navickas, E., Sasaki, K., Yildiz, B., Tuller, H., Friedbacher, G., Hutter, H., & Fleig, J. (2017). Experimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film Electrodes. <i>Journal of The Electrochemical Society</i>, <i>164</i>(7), 809–814. https://doi.org/10.1149/2.0711707jes</div>
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The effect of an applied overpotential on oxygen isotope incorporation and diffusion in oxide thin film electrodes is investigated by a novel experimental approach. A special electrode geometry leads to in-plane electron flow, perpendicular oxide ion flow and a well-defined laterally varying driving force. This design allows one to obtain a series of tracer depth profiles induced by a range of overpotentials on one and the same thin film. The approach was applied to La0.8Sr0.2MnO3 (LSM) thin films deposited by pulsed laser deposition (PLD) on yttria stabilized zirconia (YSZ) single crystals. Tracer depth profiles were measured by secondary ion mass spectrometry (SIMS). These depth profiles include examples of pronounced apparent uphill diffusion that can be explained by considering an interplay of polarization-induced changes in stoichiometry within the LSM grains combined with fast oxygen transport along the grain boundaries.
en
dc.description.sponsorship
Fonds zur Förderung der Wissenschaftlichen Forschung
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dc.language
English
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dc.language.iso
en
-
dc.publisher
The Electrochemical Society (ECS)
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dc.relation.ispartof
Journal of The Electrochemical Society
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dc.rights.uri
http://creativecommons.org/licenses/by/4.0/
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dc.subject
cathodic bias
en
dc.subject
grain boundaries
en
dc.subject
LSM thin films
en
dc.subject
SIMS
en
dc.subject
tracer diffusion
en
dc.title
Experimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film Electrodes
en
dc.type
Article
en
dc.type
Artikel
de
dc.rights.license
Creative Commons Namensnennung 4.0 International
de
dc.rights.license
Creative Commons Attribution 4.0 International
en
dc.contributor.affiliation
Kyushu University, Japan
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dc.contributor.affiliation
Massachusetts Institute of Technology, United States of America (the)
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dc.contributor.affiliation
Kyushu University, Japan
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dc.description.startpage
809
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dc.description.endpage
814
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dc.relation.grantno
F4509-N16
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dc.rights.holder
The Author(s) 2017
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dc.type.category
Original Research Article
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tuw.container.volume
164
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tuw.container.issue
7
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true
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tuw.peerreviewed
true
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tuw.version
vor
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dcterms.isPartOf.title
Journal of The Electrochemical Society
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tuw.publication.orgunit
E164 - Institut für Chemische Technologien und Analytik
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tuw.publisher.doi
10.1149/2.0711707jes
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dc.date.onlinefirst
2017-05-16
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dc.identifier.eissn
1945-7111
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dc.identifier.libraryid
AC15557364
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dc.description.numberOfPages
6
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dc.identifier.urn
urn:nbn:at:at-ubtuw:3-8246
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tuw.author.orcid
0000-0001-6339-8341
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0000-0003-4217-401X
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tuw.author.orcid
0000-0001-8339-3222
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tuw.author.orcid
0000-0002-8401-6717
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dc.rights.identifier
CC BY 4.0
de
dc.rights.identifier
CC BY 4.0
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wb.sci
true
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item.languageiso639-1
en
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research article
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open
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with Fulltext
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Publications
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http://purl.org/coar/resource_type/c_2df8fbb1
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Open Access
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E164-04-3 - Forschungsgruppe Festkörperionik
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E164 - Institut für Chemische Technologien und Analytik
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crisitem.author.dept
Kyushu University
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crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
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crisitem.author.dept
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
