<div class="csl-bib-body">
<div class="csl-entry">Schwab, S., Jung, J. P. H., Appenroth, J., Pittenauer, E., Allmaier, G., Gruber, S., Bauer, M., Miethaner, S., Nelhiebel, M., & Hutter, H. (2017). Reduction of Sodium Migration in Polymers by Addition of 15-Crown-5 Ether as Getter Substance. <i>ECS Journal of Solid State Science and Technology</i>, <i>6</i>(7), 70–75. https://doi.org/10.1149/2.0111707jss</div>
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Already small amounts of ion contamination within sensitive areas of high voltage transistors can cause severe damage to semiconductor devices. Therefore, it is of utmost importance to hinder mobile ions from reaching critical regions (e.g., the gate oxide layer). To protect semiconductor devices from environmental influences and contamination, polymers are used for chip encapsulation. Reduction of ion migration within these polymers can increase the reliability of the semiconductor device. Crown ethers are well known to form stable complexes with alkali cations. Within this work the influence of 15-crown-5 ether on the sodium migration in poly-methyl methacrylate and polyimide will be evaluated by means of ion conductivity measurements.
en
dc.description.sponsorship
Austrian Research Promotion Agency (FFG)
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dc.description.sponsorship
Carinthian Economic Promotion Fund (KWF)
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dc.language
English
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dc.language.iso
en
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dc.publisher
The Electrochemical Society
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dc.relation.ispartof
ECS Journal of Solid State Science and Technology
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dc.rights.uri
http://creativecommons.org/licenses/by-nc-nd/4.0/
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dc.subject
Corrosion
en
dc.subject
Crown ether
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dc.subject
Ion Migration
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dc.subject
Polymers
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dc.subject
Reliability
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dc.subject
Semiconductor
en
dc.title
Reduction of Sodium Migration in Polymers by Addition of 15-Crown-5 Ether as Getter Substance
en
dc.type
Article
en
dc.type
Artikel
de
dc.rights.license
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International
en
dc.rights.license
Creative Commons Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International
de
dc.contributor.affiliation
TU Wien, Österreich
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dc.contributor.affiliation
Infineon
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dc.contributor.affiliation
Infineon
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dc.description.startpage
70
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dc.description.endpage
75
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dc.relation.grantno
854247
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dc.relation.grantno
KWF-1521/28101/40388
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dc.rights.holder
The Author(s) 2017
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dc.type.category
Original Research Article
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tuw.container.volume
6
-
tuw.container.issue
7
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.version
vor
-
dcterms.isPartOf.title
ECS Journal of Solid State Science and Technology
-
tuw.publication.orgunit
E164 - Institut für Chemische Technologien und Analytik
-
tuw.publisher.doi
10.1149/2.0111707jss
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dc.date.onlinefirst
2017-05-11
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dc.identifier.eissn
2162-8777
-
dc.identifier.libraryid
AC15558272
-
dc.description.numberOfPages
6
-
dc.identifier.urn
urn:nbn:at:at-ubtuw:3-8266
-
tuw.author.orcid
0000-0002-8409-802X
-
tuw.author.orcid
0000-0002-1438-9462
-
tuw.author.orcid
0000-0002-3007-0734
-
dc.rights.identifier
CC BY-NC-ND 4.0
en
dc.rights.identifier
CC BY-NC-ND 4.0
de
wb.sci
true
-
item.mimetype
application/pdf
-
item.openairetype
research article
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
item.openaccessfulltext
Open Access
-
item.grantfulltext
open
-
item.cerifentitytype
Publications
-
item.fulltext
with Fulltext
-
item.languageiso639-1
en
-
crisitem.author.dept
E164 - Institut für Chemische Technologien und Analytik
