<div class="csl-bib-body">
<div class="csl-entry">Scales, Z., Reisinger, M., Koller, C., Taylor, A., & Stöger-Pollach, M. (2022, May 8). <i>Physical Characterization of Crystal Defects in Gallium Nitride</i> [Poster Presentation]. 5th QEM, Port-Bararès, France. http://hdl.handle.net/20.500.12708/81242</div>
</div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/81242
-
dc.language.iso
en
-
dc.subject
EELS
en
dc.subject
CL
en
dc.subject
TEM
en
dc.title
Physical Characterization of Crystal Defects in Gallium Nitride
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
KAI GmbH, Austria
-
dc.contributor.affiliation
Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Austria
-
dc.contributor.affiliation
KAI GmbH, Austria
-
dc.type.category
Poster Presentation
-
tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M4
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Non-metallic Materials
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
tuw.author.orcid
0000-0001-8342-8368
-
tuw.author.orcid
0000-0003-1649-3092
-
tuw.author.orcid
0000-0003-1006-1205
-
tuw.author.orcid
0000-0002-5450-4621
-
tuw.event.name
5th QEM
-
tuw.event.startdate
08-05-2022
-
tuw.event.enddate
20-05-2022
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
Port-Bararès
-
tuw.event.country
FR
-
tuw.event.presenter
Scales, Ze
-
wb.sciencebranch
Nanotechnologie
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2100
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
25
-
wb.sciencebranch.value
50
-
wb.sciencebranch.value
25
-
item.openairecristype
http://purl.org/coar/resource_type/c_18co
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item.grantfulltext
none
-
item.languageiso639-1
en
-
item.cerifentitytype
Publications
-
item.fulltext
no Fulltext
-
item.openairetype
conference poster not in proceedings
-
crisitem.author.dept
KAI GmbH, Austria
-
crisitem.author.dept
Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Austria
-
crisitem.author.dept
KAI GmbH, Austria
-
crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie