DC Field
Value
Language
dc.contributor.author
Scales, Ze
-
dc.contributor.author
Reisinger, Michael
-
dc.contributor.author
Taylor, Aidan
-
dc.contributor.author
Nelhiebel, Michael
-
dc.contributor.author
Stöger-Pollach, Michael
-
dc.date.accessioned
2022-10-07T10:58:34Z
-
dc.date.available
2022-10-07T10:58:34Z
-
dc.date.issued
2022-11-24
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Scales, Z., Reisinger, M., Taylor, A., Nelhiebel, M., &#38; Stöger-Pollach, M. (2022, November 24). <i>Physical Characterization of Dislocations in III-N Semiconductors including Quantification and Classification</i> [Poster Presentation]. Infineon meets University, München, Germany. http://hdl.handle.net/20.500.12708/81243</div> </div>
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/81243
-
dc.description.sponsorship
Infineon Technologies Ausria AG
-
dc.language.iso
en
-
dc.subject
EELS
en
dc.subject
CL
en
dc.subject
TEM
en
dc.title
Physical Characterization of Dislocations in III-N Semiconductors including Quantification and Classification
en
dc.type
Presentation
en
dc.type
Vortrag
de
dc.contributor.affiliation
KAI GmbH, Austria
-
dc.contributor.affiliation
Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Austria
-
dc.relation.grantno
6000010595
-
dc.type.category
Poster Presentation
-
tuw.publication.invited
invited
-
tuw.project.title
Multidisziplinäre Charakterisierung & Modellierung für innovative Prozess- & Produktintegration von Leistungshalbleitern
-
tuw.researchinfrastructure
Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
M4
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Non-metallic Materials
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
tuw.author.orcid
0000-0001-8342-8368
-
tuw.author.orcid
0000-0003-1006-1205
-
tuw.author.orcid
0000-0002-5302-8109
-
tuw.author.orcid
0000-0002-5450-4621
-
tuw.event.name
Infineon meets University
en
tuw.event.startdate
24-11-2022
-
tuw.event.enddate
24-11-2022
-
tuw.event.online
On Site
-
tuw.event.type
Event for scientific audience
-
tuw.event.place
München
-
tuw.event.country
DE
-
tuw.event.institution
Infineon
-
tuw.event.presenter
Scales, Ze
-
tuw.event.track
Single Track
-
wb.sciencebranch
Nanotechnologie
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2100
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
25
-
wb.sciencebranch.value
50
-
wb.sciencebranch.value
25
-
item.languageiso639-1
en
-
item.openairetype
conference poster not in proceedings
-
item.grantfulltext
none
-
item.fulltext
no Fulltext
-
item.cerifentitytype
Publications
-
item.openairecristype
http://purl.org/coar/resource_type/c_18co
-
crisitem.author.dept
Kompetenzzentrum Autombil- und Industrieelektronik GmbH, Austria
-
crisitem.author.dept
Kompetenzzentrum Automobil- und Industrieelektronik GmbH
-
crisitem.author.dept
KAI GmbH
-
crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
crisitem.author.orcid
0000-0001-8342-8368
-
crisitem.author.orcid
0000-0003-1006-1205
-
crisitem.author.orcid
0000-0002-5302-8109
-
crisitem.author.orcid
0000-0002-5450-4621
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.project.funder
Infineon Technologies Ausria AG
-
crisitem.project.grantno
6000010595
-
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