DC FieldValueLanguage
dc.contributor.advisorStreli, Christina-
dc.contributor.authorIro, Michael-
dc.date.accessioned2020-06-29T20:50:20Z-
dc.date.issued2019-
dc.date.submitted2019-05-
dc.identifier.urihttps://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-124841-
dc.identifier.urihttp://hdl.handle.net/20.500.12708/8526-
dc.descriptionAbweichender Titel nach Übersetzung der Verfasserin/des Verfassers-
dc.description.abstractCombined Grazing incidence X-Ray fluorescence and X-Ray reflectometry analysis, as proposed by de Boer [1], needs a sophisticated software using global optimization algorithms to fit calculated curves for a specific sample-setup-model to measurement results of angle dependent fluorescence signals from ultra thin layers on a reflecting surface (e.g. Si-wafer). The software package jGiXa, developed by Ingerle [2] for this purpose, used a graphical user interface and optimization algorithms based on MatLab code and a Java based calculation of the spectra. This diploma thesis focuses on the further development of the jGiXa software. Therefor a Java based graphical user interface and global optimization algorithm were implemented, allowing jGiXa to work as a Java standalone software. This is advantageous in respect to portability, usability, maintainability, scalability, performance, etc. To further optimize the performance of the software a meta optimization was implemented to find ideal parameters for the global optimization algorithm. Furthermore a new model for intermediate layers was implemented, to allow sample models with a continuous transition between layers. To test the new software, comparison evaluations for different measurements were made.en
dc.format57 Seiten-
dc.languageEnglish-
dc.language.isoen-
dc.subjectGIXRF /de
dc.subjectGIXRFen
dc.subjectGEXRFen
dc.subjectUltra thin layer analysisen
dc.subjectmodelling&simulationen
dc.titleFurther development of the software jGiXa for grazing incidence X-ray fluoresence analysisen
dc.title.alternativeWeiterentwicklung der Auswertesoftware JGIXA für Röntgenfluoreszenzanalyse unter streifendem Einfallde
dc.typeThesisen
dc.typeHochschulschriftde
dc.publisher.placeWien-
tuw.thesisinformationTechnische Universität Wien-
dc.contributor.assistantIngerle, Dieter-
tuw.publication.orgunitE141 - Atominstitut-
dc.type.qualificationlevelDiploma-
dc.identifier.libraryidAC15361071-
dc.description.numberOfPages57-
dc.identifier.urnurn:nbn:at:at-ubtuw:1-124841-
dc.thesistypeDiplomarbeitde
dc.thesistypeDiploma Thesisen
item.openairetypeThesis-
item.openairetypeHochschulschrift-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextwith Fulltext-
item.cerifentitytypePublications-
item.cerifentitytypePublications-
item.grantfulltextopen-
item.languageiso639-1en-
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