Proceedings 2022 IEEE International Integrated Reliability Workshop (IIRW)
Book title Buchtitel
Proceedings 2022 IEEE International Integrated Reliability Workshop (IIRW)
ISBN
978-1-6654-5368-4
Subject
- 1 Charge Trapping
- 1 Complementary cumulative distribution function (CCDF)
- 1 Current measurement
- 1 Exponential distribution
- 1 Exponential step height distribution
- 1 Nanoscale devices
- 1 Negative bias temperature instability
- 1 Positive and negative bias temperature instability (PBTI, NBTI)
- 1 Silicon compounds
- 1 Single defects
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Date issued
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