Noise in Nanoscale Semiconductor Devices
Book title Buchtitel
Noise in Nanoscale Semiconductor Devices
Editor Herausgeber_in
Publisher Herausgeber
Springer International Publishing
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Stampfer, Bernhard ; Grill, Alexander ; Waltl, Michael ; Grasser, Tibor | Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals | Buchbeitrag Book Contribution  | 2020 | |
| 2 | Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Wimmer, Yannick ; Waltl, Michael ; Grasser, Tibor ; Grasser, Tibor | Atomistic Modeling of Oxide Defects | Buchbeitrag Book Contribution | 2020 |