Noise in Nanoscale Semiconductor Devices

Book title Buchtitel

Editor Herausgeber_in

Grasser, Tibor

Publisher Herausgeber

Springer International Publishing

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		Preview	Author(s)	Title	Type	Issue Date
	1		Stampfer, Bernhard ; Grill, Alexander ; Waltl, Michael	Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals	Buchbeitrag Book Contribution	2020
	2		Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Wimmer, Yannick ; Waltl, Michael ; Grasser, Tibor	Atomistic Modeling of Oxide Defects	Buchbeitrag Book Contribution	2020