Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals

Stampfer, Bernhard; Grill, Alexander; Waltl, Michael

doi:10.1007/978-3-030-37500-3_7

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Record link:

http://hdl.handle.net/20.500.12708/30291

Title:

Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals

Citation:

Stampfer, B., Grill, A., & Waltl, M. (2020). Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals. In T. Grasser (Ed.), Noise in Nanoscale Semiconductor Devices (pp. 229–257). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_7

Publisher DOI:

10.1007/978-3-030-37500-3_7

Publication Type:

Book Contribution - Edited Volume Contribution

Authors:

Stampfer, Bernhard
Grill, Alexander
Waltl, Michael

Organisational Unit:

E360 - Institut für Mikroelektronik

Published in:

Noise in Nanoscale Semiconductor Devices

Date (published):

2020