Book of Abstract, 11th Europ. Conf. on Applications of Surface Analysis (ECASIA´05)
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Book of Abstract, 11th Europ. Conf. on Applications of Surface Analysis (ECASIA´05)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Forsich, Christian ; Kolm, Ralph ; Tomastik, Christian ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. | Control of the composition of titanium nitride coatings during plasma-assisted chemical vapour deposition by spectroscopic ellipsometry | Konferenzbeitrag Inproceedings | 2005 | |
| 2 | Forsich, Christian ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. | On the spectroscopic ellipsometry for monitoring of diamond-like carbon (DLC) growth during plasma-assisted chemical vapour deposition (PACVD) | Konferenzbeitrag Inproceedings | 2005 | |
| 3 | Forsich, Christian ; Gebeshuber, I.C. ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. | Spectroscopic ellipsometry as an in-situ diagnostic tool for the avoidance of compound layer formation during plasma nitriding | Konferenzbeitrag Inproceedings | 2005 |