Proceedings of the 57th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) and the 8th International Conference on Residual Stresses (ICRS-8)

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Book details Buch-Details

Book title Buchtitel
Proceedings of the 57th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) and the 8th International Conference on Residual Stresses (ICRS-8)
 
Publisher Herausgeber
International Centre for Diffraction Data
 
Place of publishing Erscheinungsort
Vol. 52
 

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PreviewAuthor(s)TitleTypeIssue Date
1Horntrich, C. ; Meirer, F. ; Streli, Christina ; Kregsamer, Peter ; Pepponi, Giancarlo ; Zöger, N. ; Wobrauschek, Peter Influence of the sample morphology on total reflection X-ray fluorescence analysisKonferenzbeitrag Inproceedings2008
2Pyzalla, Anke ; Dumont, M. ; Zöger, N. ; Streli, Christina ; Wobrauschek, Peter ; Sander, M. Synchrotron XRF analysis of element distribution in fossilized sauropod dinosaur bonesKonferenzbeitrag Inproceedings2008