| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Sheikholeslami, A. ; Parhami, F. ; Heinzl, R. ; Al-Ani, E. ; Heitzinger, C. ; Badrieh, F. ; Puchner, H. ; Grasser, T. ; Selberherr, S. | Applications of Three-Dimensional Topography Simulation in the Design of Interconnect Lines | Konferenzbeitrag Inproceedings | 2005 |
| 2 | | Schwaha, Philipp ; Heinzl, Rene ; Spevak, Michael ; Grasser, Tibor | Coupling Three-Dimensional Mesh Adaptation with an A Posteriori Error Estimator | Konferenzbeitrag Inproceedings | 2005 |
| 3 | | Wessner, W. ; Ceric, H. ; Cervenka, J. ; Selberherr, S. | Dynamic Mesh Adaptation for Three-Dimensional Electromigration Simulation | Konferenzbeitrag Inproceedings | 2005 |
| 4 | | Ungersboeck, E. ; Kosina, H. | The Effect of Degeneracy on Electron Transport in Strained Silicon Inversion Layers | Konferenzbeitrag Inproceedings | 2005 |
| 5 | | Karner, M. ; Gehring, A. ; Kosina, H. ; Selberherr, S. | Efficient Calculation of Quasi-Bound State Tunneling in CMOS Devices | Konferenzbeitrag Inproceedings | 2005 |
| 6 | | Heinzl, R. ; Grasser, T. | Generalized Comprehensive Approach for Robust Three-Dimensional Mesh Generation for TCAD | Konferenzbeitrag Inproceedings | 2005 |
| 7 | | Pourfath, M. ; Kosina, H. ; Cheong, B.H. ; Park, W.J. | Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect Transistors | Konferenzbeitrag Inproceedings | 2005 |
| 8 | | Entner, Robert ; Gehring, Andreas ; Kosina, Hans ; Grasser, Tibor ; Selberherr, Siegfried | Modeling of Tunneling Currents for Highly Degraded CMOS Devices | Konferenzbeitrag Inproceedings | 2005 |
| 9 | | Wittmann, Robert ; Hössinger, Andreas ; Selberherr, Siegfried | Monte Carlo Simulation of Ion Implantation for Doping of Strained Silicon MOSFETs | Konferenzbeitrag Inproceedings | 2005 |
| 10 | | Dhar, S. ; Karlowatz, G. ; Ungersboeck, E. ; Kosina, H. | Numerical and Analytical Modeling of the High-Field Electron Mobility in Strained Silicon | Konferenzbeitrag Inproceedings | 2005 |
| 11 | | Hollauer, Ch. ; Ceric, H. ; Selberherr, S. | Three-Dimensional Simulation of Stress Dependent Thermal Oxidation | Konferenzbeitrag Inproceedings | 2005 |