| Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Grasser, Tibor ; Wagner, Paul-Jürgen ; Hehenberger, Philipp Paul ; Gös, Wolfgang ; Kaczer, Ben | A Rigorous Study of Measurement Techniques for Negative Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2007 |
| 2 | | Reisinger, H. ; Grasser, Tibor ; Schlünder, C. | A Study of NBTI by the Statistical Analysis of the Properties of Individual Defects in pMOSFETS | Konferenzbeitrag Inproceedings | 2009 |
| 3 | | Bindu, B. ; Gös, Wolfgang ; Kaczer, Ben ; Grasser, Tibor | Analytical Solution of the Switching Trap Model for Negative Bias Temperature Stress | Konferenzbeitrag Inproceedings | 2009 |
| 4 | | Gös, Wolfgang ; Grasser, Tibor | Charging and Discharging of Oxide Defects in Reliability Issues | Konferenzbeitrag Inproceedings | 2007 |
| 5 | | Coppeta, Raffaele Alberto ; Ceric, Hajdin ; Holec, David ; Grasser, Tibor | Critical thickness for GaN thin film on AlN substrate | Konferenzbeitrag Inproceedings | 2013 |
| 6 | | Southwick III, R. G. ; Purnell, Shem T. ; Rapp, Blake A. ; Thompson, Ryan J. ; Pugmire, Shane K ; Kaczer, Ben ; Grasser, Tibor ; Knowlton, B. | Cryogenic to Room Temperature Effects of NBTI in High-k PMOS Devices | Konferenzbeitrag Inproceedings | 2011 |
| 7 | | Grasser, Tibor ; Kaczer, Ben ; Aichinger, T. ; Gös, Wolfgang ; Nelhiebel, M. | Defect Creation Stimulated by Thermally Activated Hole Trapping as the Driving Force Behind Negative Bias Temperature Instability in SiO2, SiON, and High-k Gate Stacks | Konferenzbeitrag Inproceedings | 2008 |
| 8 | | Rott, Gunnar Andreas ; Nielen, H. ; Reisinger, H. ; Gustin, W. ; Tyaginov, S. E. ; Grasser, Tibor | Drift Compensating Effect during Hot-Carrier Degradation of 130nm Dual Gate Oxide p-channel Transistors | Konferenzbeitrag Inproceedings | 2013 |
| 9 | | Tyaginov, S. E. ; Bina, Markus ; Franco, J. ; Osintsev, Dimitry ; Wimmer, Yannick ; Kaczer, Ben ; Grasser, Tibor | Essential Ingredients for Modeling of Hot-Carrier Degradation in Ultra-Scaled MOSFETs | Konferenzbeitrag Inproceedings | 2013 |
| 10 | | Wittmann, Robert ; Puchner, H ; Hinh, L ; Ceric, Hajdin ; Gehring, Andreas ; Selberherr, Siegfried | Impact of NBTI-driven Parameter Degradation on Lifetime of a 90nm p-MOSFET | Konferenzbeitrag Inproceedings | 2005 |
| 11 | | Bina, Markus ; Aichinger, T. ; Pobegen, G. ; Gös, Wolfgang ; Grasser, Tibor | Modeling of DCIV Recombination Currents Using A Multistate Multiphonon Model | Konferenzbeitrag Inproceedings | 2011 |
| 12 | | Grasser, Tibor ; Gös, Wolfgang ; Kaczer, Ben | Modeling of Dispersive Transport in the Context of Negative Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2006 |
| 13 | | Schanovsky, Franz ; Grasser, Tibor | On the Microscopic Limit of the Reaction-Diffusion Model for the Negative Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2011 |
| 14 | | Southwick III, R. G. ; Knowlton, B. ; Kaczer, Ben ; Grasser, Tibor | On the Thermal Activation of Negative Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2009 |
| 15 | | Kaczer, Ben ; Toledano-Luque, M. ; Franco, J. ; Grasser, Tibor ; Roussel, Ph. J. ; Camargo, V. V. A. ; Mahato, S. ; Simoen, E. ; Catthoor, F. ; Wirth, G.I. ; Groeseneken, G. | Recent Trends in CMOS Reliability: From Individual Traps to Circuit Simulations | Konferenzbeitrag Inproceedings | 2011 |
| 16 | | Franco, J. ; Kaczer, Ben ; Roussel, Philippe J. ; Toledano-Luque, M. ; Weckx, P. ; Grasser, Tibor | Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability | Konferenzbeitrag Inproceedings | 2013 |
| 17 | | Kaczer, Ben ; Chen, C. S. ; Watt, J. T. ; Chanda, K. ; Weckx, P. ; Toledano-Luque, M. ; Groeseneken, G. ; Grasser, Tibor | Reliability and Performance Considerations for NMOSFET Pass Gates in FPGA Applications | Konferenzbeitrag Inproceedings | 2013 |
| 18 | | Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. | The Effect of Recovery on NBTI Characterization of Thick Non-Nitrided Oxides | Konferenzbeitrag Inproceedings | 2008 |
| 19 | | Ryan, J. T. ; Lenahan, P. M. ; Grasser, Tibor ; Enichlmair, H. | What Triggers NBTI? An "On The Fly" Electron Spin Resonance Approach | Konferenzbeitrag Inproceedings | 2009 |
