| Preview | Authors / Editors | Title | Type | Issue Date |
1 | | Schanovsky, F. ; Baumgartner, O. ; Goes, W. ; Grasser, T. | A detailed evaluation of model defects as candidates for the bias temperature instability | Konferenzbeitrag Inproceedings | 2013 |
2 | | Schanovsky, F. ; Goes, W. ; Grasser, T. | Advanced modeling of charge trapping at oxide defects | Konferenzbeitrag Inproceedings | 2013 |
3 | | Baumgartner, O. ; Bina, M. ; Goes, W. ; Schanovsky, F. ; Toledano-Luque, M. ; Kaczer, B. ; Kosina, H. ; Grasser, T. | Direct tunneling and gate current fluctuations | Konferenzbeitrag Inproceedings | 2013 |
4 | | Zisser, W. H. ; Ceric, H. ; de Orio, R. L. ; Selberherr, S. | Electromigration analyses of open TSVs | Konferenzbeitrag Inproceedings | 2013 |
5 | | Coppeta, R. A. ; Ceric, H. ; Karunamurthy, B. ; Grasser, T. | Epitaxial Volmer-Weber growth modelling | Konferenzbeitrag Inproceedings | 2013 |
6 | | Osintsev, Dmitri ; Sverdlov, Viktor ; Selberherr, Siegfried | Evaluation of spin lifetime in strained UT2B silicon-on-insulator MOSFETs | Konferenzbeitrag Inproceedings | 2013 |
7 | | Kaczer, B. ; Afanas'ev, V. V. ; Rott, K. ; Cerbu, F. ; Franco, J. ; Goes, W. ; Grasser, T. ; Madia, O. ; Nguyen, A. P. D. ; Stesmans, A. ; Reisinger, H. ; Toledano-Luque, M. ; Weckx, P. | Experimental characterization of BTI defects | Konferenzbeitrag Inproceedings | 2013 |
8 | | Neophytou, Neophytos ; Stanojevic, Zlatan ; Kosina, Hans | Full band calculations of low-field mobility in p-type silicon nanowire MOSFETs | Konferenzbeitrag Inproceedings | 2013 |
9 | | Ceric, H. ; Singulani, A. Pires ; de Orio, R. L. ; Selberherr, S. | Impact of intermetallic compound on solder bump electromigration reliability | Konferenzbeitrag Inproceedings | 2013 |
10 | | de Orio, R. L. ; Ceric, H. ; Selberherr, S. | Influence of temperature on the standard deviation of electromigration lifetimes | Konferenzbeitrag Inproceedings | 2013 |
11 | | Filipovic, Lidija ; Baumgartner, Oskar ; Kosina, Hans | Modeling direct band-to-band tunneling using QTBM | Konferenzbeitrag Inproceedings | 2013 |
12 | | Filipovic, Lado ; Selberherr, Siegfried ; Mutinati, G. C. ; Brunet, E. ; Steinhauer, S. ; Köck, Anton ; Teva, Jordi ; Kraft, J. ; Siegert, Joerg ; Schrank, F. ; Gspan, Christian ; Grogger, Werner | Modeling the growth of thin SnO2 films using spray pyrolysis deposition | Konferenzbeitrag Inproceedings | 2013 |
13 | | Mahmoudi, Hiwa ; Windbacher, Thomas ; Sverdlov, Viktor ; Selberherr, Siegfried | Performance analysis and comparison of two 1T/1MTJ-based logic gates | Konferenzbeitrag Inproceedings | 2013 |
14 | | Amoroso, S. M. ; Gerrer, L. ; Asenov, A. ; Sellier, J. M. ; Dimov, I. ; Nedjalkov, M. ; Selberherr, S. | Quantum insights in gate oxide charge-trapping dynamics in nanoscale MOSFETs | Konferenzbeitrag Inproceedings | 2013 |
15 | | Windbacher, Thomas ; Mahmoudi, Hiwa ; Sverdlov, Viktor ; Selberherr, Siegfried | Rigorous simulation study of a novel non-volatile magnetic flip-flop | Konferenzbeitrag Inproceedings | 2013 |
16 | | Singulani, A. P. ; Ceric, H. ; Selberherr, S. | Stress estimation in open tungsten TSV | Konferenzbeitrag Inproceedings | 2013 |
17 | | Stanojevic, Z. ; Kosina, H. | Surface-roughness-scattering in non-planar channels — The role of band anisotropy | Konferenzbeitrag Inproceedings | 2013 |
18 | | Sellier, J. M. ; Nedjalkov, M. ; Dimov, I. ; Selberherr, S. | Two-dimensional transient wigner particle model | Konferenzbeitrag Inproceedings | 2013 |