Proceedings of the 21#^{st} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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Proceedings of the 21#^{st} European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tyaginov, S. E. ; Starkov, Ivan ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor | Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling | Konferenzbeitrag Inproceedings | 2010 |