GADEST 2011: Abstract Booklet
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GADEST 2011: Abstract Booklet
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Starkov, Ivan ; Tyaginov, S. E. ; Enichlmair, H. ; Park, Jong Mun ; Ceric, Hajdin ; Grasser, Tibor | Accurate Extraction of MOSFET Interface State Spatial Distribution from Charge Pumping Measurements | Konferenzbeitrag Inproceedings | 2011 | |
| 2 | Gös, Wolfgang ; Schanovsky, Franz ; Reisinger, H. ; Kaczer, Ben ; Grasser, Tibor | Bistable Defects as the Cause for NBTI and RTN | Konferenzbeitrag Inproceedings | 2011 |