2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
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2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, H. ; De Orio, R. L. ; Zisser, W. H. ; Selberherr, S. | Ab initio method for electromigration analysis | Konferenzbeitrag Inproceedings | 2012 | |
| 2 | Starkov, I. ; Enichlmair, H. ; Tyaginov, S. ; Grasser, T. | Charge-pumping extraction techniques for hot-carrier induced interface and oxide trap spatial distributions in MOSFETs | Konferenzbeitrag Inproceedings | 2012 | |
| 3 | Tyaginov, S. E. ; Starkov, I. A. ; Triebl, O. ; Karner, M. ; Kernstock, Ch. ; Jungemann, C. ; Enichlmair, H. ; Park, J.M. ; Grasser, T. | Impact of gate oxide thickness variations on hot-carrier degradation | Konferenzbeitrag Inproceedings | 2012 |