IEEE International Integrated Reliability Workshop Final Report

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IEEE International Integrated Reliability Workshop Final Report
 

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PreviewAuthor(s)TitleTypeIssue Date
1Waltl, Michael ; Wagner, Paul-Jürgen ; Reisinger, H. ; Rott, K. ; Grasser, Tibor Advanced Data Analysis Algorithms for the Time-Dependent Defect Spectroscopy of NBTIKonferenzbeitrag Inproceedings2012
2Rott, K. ; Schmitt-Landsiedel, D. ; Reisinger, H. ; Rott, Gunnar Andreas ; Georgakos, G ; Schluender, C ; Aresu, S. ; Gustin, W. ; Grasser, Tibor Impact and measurement of short term threshold instabilities in MOSFETs of analog circuitsKonferenzbeitrag Inproceedings2012
3Tyaginov, S. E. ; Grasser, Tibor Modeling of Hot-Carrier Degradation: Physics and Controversial IssuesKonferenzbeitrag Inproceedings2012
4Wagner, Paul-Jürgen ; Kaczer, Ben ; Scholten, A ; Reisinger, H. ; Bychikhin, Sergey ; Pogany, Dionyz ; Vandamme, L.K.J. ; Grasser, Tibor On the Correlation Between NBTI, SILC, and Flicker NoiseKonferenzbeitrag Inproceedings2012