IEEE International Integrated Reliability Workshop Final Report
Book title Buchtitel
IEEE International Integrated Reliability Workshop Final Report
Results 1-4 of 4 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Waltl, Michael ; Wagner, Paul-Jürgen ; Reisinger, H. ; Rott, K. ; Grasser, Tibor | Advanced Data Analysis Algorithms for the Time-Dependent Defect Spectroscopy of NBTI | Konferenzbeitrag Inproceedings | 2012 | |
| 2 | Rott, K. ; Schmitt-Landsiedel, D. ; Reisinger, H. ; Rott, Gunnar Andreas ; Georgakos, G ; Schluender, C ; Aresu, S. ; Gustin, W. ; Grasser, Tibor | Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits | Konferenzbeitrag Inproceedings | 2012 | |
| 3 | Tyaginov, S. E. ; Grasser, Tibor | Modeling of Hot-Carrier Degradation: Physics and Controversial Issues | Konferenzbeitrag Inproceedings | 2012 | |
| 4 | Wagner, Paul-Jürgen ; Kaczer, Ben ; Scholten, A ; Reisinger, H. ; Bychikhin, Sergey ; Pogany, Dionyz ; Vandamme, L.K.J. ; Grasser, Tibor | On the Correlation Between NBTI, SILC, and Flicker Noise | Konferenzbeitrag Inproceedings | 2012 |