Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
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Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Zisser, Wolfhard ; Ceric, Hajdin ; Weinbub, Josef ; Selberherr, Siegfried | Electromigration Reliability of Open TSV Structures | Konferenzbeitrag Inproceedings | 2014 | |
| 2 | Rott, Gunnar Andreas ; Rott, K. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor | Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel Transistors | Konferenzbeitrag Inproceedings | 2014 | |
| 3 | Filipovic, Lado ; Selberherr, Siegfried | The Effects of Etching and Deposition on the Performance and Stress Evolution of Open Through Silicon Vias | Konferenzbeitrag Inproceedings  | 2014 |