Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)

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Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
 

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PreviewAuthor(s)TitleTypeIssue Date
1Zisser, Wolfhard ; Ceric, Hajdin ; Weinbub, Josef ; Selberherr, Siegfried Electromigration Reliability of Open TSV StructuresKonferenzbeitrag Inproceedings2014
2Rott, Gunnar Andreas ; Rott, K. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel TransistorsKonferenzbeitrag Inproceedings2014
3Filipovic, Lado ; Selberherr, Siegfried The Effects of Etching and Deposition on the Performance and Stress Evolution of Open Through Silicon ViasKonferenzbeitrag Inproceedings 2014