2014 IEEE International Electron Devices Meeting

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2014 IEEE International Electron Devices Meeting
 

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PreviewAuthor(s)TitleTypeIssue Date
1Mueller, Thomas ; Furchi, Marco M. ; Pospischil, Andreas ; Polyushkin, Dmitry K. Nanophotonics with two-dimensional atomic crystalsKonferenzbeitrag Inproceedings2014
2Grasser, T. ; Goes, W. ; Wimmer, Y. ; Schanovsky, F. ; Rzepa, G. ; Waltl, M. ; Rott, K. ; Reisinger, H. ; Afanas'ev, V.V. ; Stesmans, A. ; El-Sayed, Al-Moatasem Bellah ; Shluger, A.L. On the microscopic structure of hole traps in pMOSFETsKonferenzbeitrag Inproceedings2014
3Franco, J. ; Kaczer, B. ; Waldron, N. ; Roussel, Ph.J. ; Alian, A. ; Pourghaderi, M. A. ; Ji, Z. ; Grasser, T. ; Kauerauf, T. ; Sioncke, S. ; Collaert, N. ; Thean, A. ; Groeseneken, G. RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETsKonferenzbeitrag Inproceedings2014