El-Sayed, A.-M.
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El-Sayed, A.-M.
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tyaginov, S. E. ; El-Sayed, A.-M. ; Makarov, Alexander ; Chasin, A ; Arimura, H ; Vandemaele, Michiel ; Jech, Markus ; Capogreco, Elena ; Witters, L. ; Grill, Alexander ; De Keersgieter, An ; Eneman, G. ; Linten, Dimitri ; Kaczer, Ben | Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs | Konferenzbeitrag Inproceedings  | 2019 | |
| 2 | Grasser, T. ; Waltl, M. ; Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Shluger, A.L. ; Kaczer, B. | On the volatility of oxide defects: Activation, deactivation, and transformation | Konferenzbeitrag Inproceedings | 2015 | |
| 3 | Grasser, T. ; Goes, W. ; Wimmer, Y. ; Schanovsky, F. ; Rzepa, G. ; Waltl, M. ; Rott, K. ; Reisinger, H. ; Afanas'ev, V.V. ; Stesmans, A. ; El-Sayed, A.-M. ; Shluger, A.L. | On the microscopic structure of hole traps in pMOSFETs | Konferenzbeitrag Inproceedings | 2014 |