2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
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2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tyaginov, S. ; Bina, M. ; Franco, J. ; Wimmer, Y. ; Rudolf, F. ; Enichlmair, H. ; Park, J.M. ; Kaczer, B. ; Ceric, H. ; Grasser, T. | Dominant mechanisms of hot-carrier degradation in short- and long-channel transistors | Konferenzbeitrag Inproceedings | 2014 | |
| 2 | Giering, Kay-Uwe ; Sohrmann, Christoph ; Rzepa, Gerhard ; Heis, Leonhard ; Grasser, Tibor ; Jancke, Roland | NBTI modeling in analog circuits and its application to long-term aging simulations | Konferenzbeitrag Inproceedings | 2014 | |
| 3 | de Orio, R. L. ; Gousseau, S. ; Moreau, S. ; Cerice, H. ; Selberherr, S. ; Farcy, A. ; Bay, F. ; Inal, K. ; Montmitonnet, P. | On the material depletion rate due to electromigration in a copper TSV structure | Konferenzbeitrag Inproceedings | 2014 | |
| 4 | Wimmer, Y. ; Tyaginov, S. ; Rudolf, F. ; Rupp, K. ; Bina, M. ; Enichlmair, H. ; Park, J.M. ; Minixhofer, R. ; Ceric, H. ; Grasser, T. | Physical modeling of hot-carrier degradation in nLDMOS transistors | Konferenzbeitrag Inproceedings | 2014 |