2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
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2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Sharma, Prateek ; Tyaginov, Stanislav ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Bina, Markus ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor | Predictive and efficient modeling of hot-carrier degradation in nLDMOS devices | Konferenzbeitrag Inproceedings | 2015 |