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Abstracts Graphene 2015
 

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1Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M.C. ; Grasser, Tibor Temperature Dependence of Hot Carrier and Positive Bias Stress Degradation in Double-Gated Graphene Field-Effect TransistorsKonferenzbeitrag Inproceedings2015