Abstracts of the 26#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Book title Buchtitel
Abstracts of the 26#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Sharma, Prateek ; Tyaginov, S. E. ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Enichlmair, H. ; Park, J.M. ; Ceric, Hajdin ; Grasser, Tibor | Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs | Konferenzbeitrag Inproceedings | 2015 | |
| 2 | Filipovic, Lado ; Singulani, Anderson P. ; Roger, Frederic ; Carniello, Sara ; Selberherr, Siegfried | Intrinsic Stress Analysis of Tungsten-Lined Open TSVs | Konferenzbeitrag Inproceedings | 2015 |