2015 45th European Solid State Device Research Conference (ESSDERC)

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	Authors / Editors	Title	Type	Issue Date
1	Gerrer, Louis ; Hussin, Razaidi ; Amoroso, Salvatore M. ; Franco, J. ; Weckx, P. ; Simicic, M. ; Horiguchi, N. ; Kaczer, Ben ; Grasser, T. ; Asenov, Asen	Experimental evidences and simulations of trap generation along a percolation path	Konferenzbeitrag Inproceedings	2015
2	Illarionov, Yury ; Waltl, Michael ; Smith, Anderson ; Vaziri, Sam ; Ostling, Mikael ; Lemme, Max ; Grasser, Tibor	Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors	Konferenzbeitrag Inproceedings	2015
3	Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, D.	Strain Engineering of Single-Layer MoS2	Konferenzbeitrag Inproceedings	2015
4	Kaczer, B. ; Franco, J. ; Weckx, P. ; Roussel, Ph. J. ; Bury, E. ; Cho, M. ; Degraeve, R. ; Linten, D. ; Groeseneken, G. ; Kukner, H. ; Raghavan, P. ; Catthoor, F. ; Rzepa, G. ; Goes, W. ; Grasser, T.	The defect-centric perspective of device and circuit reliability &#x2014; From individual defects to circuits	Konferenzbeitrag Inproceedings	2015