Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M ; Grasser, Tibor	Back Gate Bias-Temperature Instability in Single-Layer Double-Gated Graphene Field-Effect Transistors	Konferenzbeitrag Inproceedings	2015
	2		Illarionov, Yury ; Vexler, M.I. ; Fedorov, V. V. ; Suturin, S. M. ; Sokolov, N. S. ; Grasser, Tibor	Characterization of Epitaxial Calcium Fluoride as a Dielectric Material for Ultra-Thin Barrier Layers in Silicon Microelectronics	Konferenzbeitrag Inproceedings	2015