Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)
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Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M ; Grasser, Tibor | Back Gate Bias-Temperature Instability in Single-Layer Double-Gated Graphene Field-Effect Transistors | Konferenzbeitrag Inproceedings | 2015 | |
2 | Illarionov, Yury ; Vexler, M.I. ; Fedorov, V. V. ; Suturin, S. M. ; Sokolov, N. S. ; Grasser, Tibor | Characterization of Epitaxial Calcium Fluoride as a Dielectric Material for Ultra-Thin Barrier Layers in Silicon Microelectronics | Konferenzbeitrag Inproceedings | 2015 |