2015 IEEE International Integrated Reliability Workshop (IIRW)
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2015 IEEE International Integrated Reliability Workshop (IIRW)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grill, A. ; Rzepa, G. ; Lagger, P. ; Ostermaier, C. ; Ceric, Hajdin ; Grasser, T. | Charge feedback mechanisms at forward threshold voltage stress in GaN/AlGaN HEMTs | Konferenzbeitrag Inproceedings  | 2015 | |
| 2 | Tyaginov, S. ; Jech, M. ; Sharma, P. ; Franco, J. ; Kaczer, B. ; Grasser, T. | On the temperature behavior of hot-carrier degradation | Konferenzbeitrag Inproceedings | 2015 |