74#^{th }Device Research Conference Digest

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Illarionov, Yury ; Rzepa, Gerhard ; Waltl, Michael ; Pandey, H. ; Kataria, S. ; Passi, V. ; Lemme, M.C. ; Grasser, Tibor	A Systematic Study of Charge Trapping in Single-Layer Double-Gated GFETs	Konferenzbeitrag Inproceedings	2016