74#^{th }Device Research Conference Digest
Book title Buchtitel
74#^{th }Device Research Conference Digest
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Illarionov, Yury ; Rzepa, Gerhard ; Waltl, Michael ; Pandey, H. ; Kataria, S. ; Passi, V. ; Lemme, M.C. ; Grasser, Tibor | A Systematic Study of Charge Trapping in Single-Layer Double-Gated GFETs | Konferenzbeitrag Inproceedings  | 2016 |