2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
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2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Illarionov, Yu. Yu. ; Rzepa, G. ; Waltl, M. ; Knobloch, T. ; Kim, J.-S. ; Akinwande, D. ; Grasser, T. | Accurate mapping of oxide traps in highly-stable black phosphorus FETs | Konferenzbeitrag Inproceedings  | 2017 |