2018 IEEE International Reliability Physics Symposium (IRPS)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Illarionov, Yury ; Molina- Mendoza, Aday J. ; Waltl, Michael ; Knobloch, Theresia ; Furchi, Marco Mercurio ; Mueller, T. ; Grasser, Tibor	Reliability of next-generation field-effect transistors with transition metal dichalcogenides	Konferenzbeitrag Inproceedings	2018