2018 IEEE International Reliability Physics Symposium (IRPS)
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2018 IEEE International Reliability Physics Symposium (IRPS)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Illarionov, Yury ; Molina- Mendoza, Aday J. ; Waltl, Michael ; Knobloch, Theresia ; Furchi, Marco Mercurio ; Mueller, T. ; Grasser, Tibor | Reliability of next-generation field-effect transistors with transition metal dichalcogenides | Konferenzbeitrag Inproceedings  | 2018 |