2018 International Integrated Reliability Workshop (IIRW)
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2018 International Integrated Reliability Workshop (IIRW)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tyaginov, S.E. ; Jech, M. ; Rzepa, G. ; Grill, A. ; El-Sayed, A.-M. ; Pobegen, G. ; Makarov, A. ; Grasser, T. | Border Trap Based Modeling of SiC Transistor Transfer Characteristics | Konferenzbeitrag Inproceedings  | 2018 | |
| 2 | Vandemaele, Michiel ; Kaczer, Ben ; Stanojevic, Zlatan ; Tyaginov, Stanislav ; Makarov, Alexander ; Chasin, Adrian ; Mertens, Hans ; Linten, Dimitri ; Groeseneken, Guido | Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs | Konferenzbeitrag Inproceedings | 2018 | |
| 3 | Franco, J. ; Wu, Z. ; Rzepa, G. ; Ragnarsson, L.-A ; Dekkers, H. ; Vandooren, A. ; Groeseneken, G. ; Horiguchi, N. ; Collaert, N. ; Linten, D. ; Grasser, T. ; Kaczer, B. | On the Impact of the Gate Metal Work-Function on the Charge Trapping Component of BTI | Konferenzbeitrag Inproceedings | 2018 |