2019 IEEE International Reliability Physics Symposium (IRPS)

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	Authors / Editors	Title	Type	Issue Date
1	Wu, Zhicheng ; Franco, Jacopo ; Claes, Dieter ; Rzepa, Gerhard ; Roussel, Philippe J. ; Collaert, Nadine ; Groeseneken, Guido ; Linten, Dimitri ; Grasser, Tibor ; Kaczer, Ben	Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling	Konferenzbeitrag Inproceedings	2019
2	Vandemaele, Michiel ; Kaczer, Ben ; Tyaginov, Stanislav ; Stanojevic, Zlatan ; Makarov, Alexander ; Chasin, Adrian ; Bury, Erik ; Mertens, Hans ; Linten, Dimitri ; Groeseneken, Guido	Full ($V_{\mathrm{g}},\ V_{\mathrm{d}}$) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs	Konferenzbeitrag Inproceedings	2019
3	O'Sullivan, B.J. ; Ritzenthaler, R. ; Rzepa, G. ; Wu, Z. ; Litta, E. Dentoni ; Richard, O. ; Conard, T. ; Machkaoutsan, V. ; Fazan, P. ; Kim, C. ; Franco, J. ; Kaczer, B. ; Grasser, T. ; Spessot, A. ; Linten, D ; Horiguchi, N.	Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices	Konferenzbeitrag Inproceedings	2019
4	Makarov, A. ; Kaczer, B. ; Roussel, Ph. ; Chasin, A. ; Grill, A. ; Vandemaele, M. ; Hellings, G. ; El-Sayed, A.-M. ; Grasser, T. ; Linten, D. ; Tyaginov, S.	Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs	Konferenzbeitrag Inproceedings	2019