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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Tyaginov, Stanislav ; Grill, Alexander ; Vandemaele, Michiel ; Grasser, Tibor ; Hellings, Geert ; Makarov, Alexander ; Jech, Markus ; Linten, Dimitri ; Kaczer, Ben | A Compact Physics Analytical Model for Hot-Carrier Degradation | Konferenzbeitrag Inproceedings  | 2020 |
| 2 | | Waltl, Michael | Defect Spectroscopy in SiC Devices | Konferenzbeitrag Inproceedings | 2020 |
| 3 | | Ruch, Bernhard ; Pobegen, Gregor ; Schleich, Christian ; Grasser, Tibor | Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping | Konferenzbeitrag Inproceedings | 2020 |
| 4 | | Grasser, T. ; Kaczer, B. ; O'Sullivan, B. ; Rzepa, G. ; Stampfer, B. ; Waltl, M. | The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release | Konferenzbeitrag Inproceedings | 2020 |
| 5 | | Kruv, A. ; Kaczer, B. ; Grill, A ; Gonzalez, M. ; Franco, J. ; Linten, D. ; Goes, W. ; Grasser, T. ; De Wolf, I. | On the impact of mechanical stress on gate oxide trapping | Konferenzbeitrag Inproceedings | 2020 |
| 6 | | Michl, J. ; Grill, A. ; Claes, D. ; Rzepa, G. ; Kaczer, B. ; Linten, D. ; Radu, I. ; Grasser, T. ; Waltl, M. | Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures | Konferenzbeitrag Inproceedings | 2020 |
| 7 | | Grill, A. ; Bury, E. ; Michl, J. ; Tyaginov, S. ; Linten, D. ; Grasser, T. ; Parvais, B. ; Kaczer, B. ; Waltl, M. ; Radu, I. | Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures | Konferenzbeitrag Inproceedings | 2020 |
| 8 | | Berens, J. ; Weger, M. ; Pobegen, G. ; Aichinger, T. ; Rescher, G. ; Schleich, C. ; Grasser, T. | Similarities and Differences of BTI in SiC and Si Power MOSFETs | Konferenzbeitrag Inproceedings | 2020 |
