2020 IEEE International Electron Devices Meeting (IEDM)
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2020 IEEE International Electron Devices Meeting (IEDM)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor | Applicability of Shockley-Read-Hall Theory for Interface States | Konferenzbeitrag Inproceedings  | 2020 | |
| 2 | Franco, J. ; Marneffe, J.-F. ; Vandooren, Anne ; Kimura, Y ; Nyns, L ; Wu, Zhicheng ; El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic ; Claes, Dieter ; Arimura, H ; Ragnarsson, L. A. ; Afanas´Ev, V. ; Horiguchi, N. ; Linten, D ; Grasser, Tibor ; Kaczer, Ben | Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO<sub>2</sub> with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking | Konferenzbeitrag Inproceedings | 2021 |