2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

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Book details Buch-Details

Book title Buchtitel
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
 
ISBN
978-1-6654-3745-5
 
Publisher Herausgeber
IEEE
 
DOI
10.1109/EuroSOI-ULIS53016.2021
 

Publications Publikationen

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Sverdlov, Viktor ; Seiler, Heribert ; El-Sayed, Al-Motasem Bellah ; Kosina, Hans ; Cretu, Bogdan Conductance due to the Edge Modes in Nanoribbons of 2D Materials in a Topological PhaseKonferenzbeitrag Inproceedings 2021
2Lenz, Christoph ; Toifl, Alexander ; Hössinger, Andreas ; Weinbub, Josef ; Cretu, Bogdan Curvature Based Feature Detection for Hierarchical Grid Refinement in TCAD Topography SimulationsKonferenzbeitrag Inproceedings 2021
3Aguinsky, Luiz Felipe ; Wachter, Georg ; Scharinger, Alexander ; Rodrigues, Francio ; Toifl, Alexander ; Trupke, Michael ; Schmid, Ulrich ; Hössinger, Andreas ; Weinbub, Josef Feature-Scale Modeling of Low-Bias SF₆ Plasma Etching of SiKonferenzbeitrag Inproceedings 2021
4Aguinsky, Luiz Felipe ; Wachter, Georg ; Rodrigues, Francio ; Scharinger, Alexander ; Toifl, Alexander ; Trupke, Michael ; Schmid, Ulrich ; Hössinger, Andreas ; Weinbub, Josef ; Cretu, Bogdan Feature-Scale Modeling of Low-Bias SF₆ Plasma Etching of SiKonferenzbeitrag Inproceedings 2021
5El-Sayed, Al-Moatasem ; Seiler, Heribert ; Kosina, Hans ; Jech, Markus ; Waldhör, Dominic ; Sverdlov, Viktor ; Cretu, Bogdan First Principles Evaluation of Topologically Protected Edge States in MoS$_{2}$ 1T′ Nanoribbons with Realistic TerminationsKonferenzbeitrag Inproceedings 2021
6Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Cretu, Bogdan Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash MemoryKonferenzbeitrag Inproceedings 2021
7Hadamek, Tomas ; Bendra, Mario ; Fiorentini, Simone ; Ender, Johannes ; de Orio, Roberto L. ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor ; Cretu, Bogdan Temperature Increase in MRAM at Writing: A Finite Element ApproachKonferenzbeitrag Inproceedings 2021