2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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Publisher Herausgeber

EDTM

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		Preview	Author(s)	Title	Type	Issue Date
	1		Jech, M. ; Grasser, T. ; Waltl, M.	The Importance of Secondary Generated Carriers in Modeling of Full Bias Space	Konferenzbeitrag Inproceedings	2022