9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM 2025)

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Description

Event name
9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM 2025)
 
Event type
Event for scientific audience
 
Start date
09-03-2025
End date
12-03-2025
 
Location
Hong Kong
Country
China
 
Event format Veranstaltungsformat
On Site

Publications Publikationen


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PreviewAuthor(s)TitleTypeIssue Date
1Waltl, Michael ; Stampfer, Bernhard ; Lacerda de Orio, Roberto Impact of Charge Trapping at Defects on the Robustness of Electronic CircuitsInproceedings Konferenzbeitrag 30-Jun-2025