Denver X-Ray Conference

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Description

Event name
Denver X-Ray Conference
 
Event type
Event for scientific audience
 
Start date
04-08-2008
End date
08-08-2008
 
Location
Denver Colorado
Country
 
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-20 of 46 (Search time: 0.004 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Mantler, Michael Accuracy of Theoretical Influence Coefficient MethodsPräsentation Presentation2002
2Wobrauschek, Peter ; Zöger, N. ; Pepponi, Giancarlo ; Streli, Christina ; Zamini, Shokufeh Altered Pb/Ca Concentrations in different Bone Areas investigated by SR-XRFPräsentation Presentation2002
3Dirken, M.W. ; Mantler, Michael ; Wittkopp, A. Analysis of Layered Materials by XRFPräsentation Presentation2002
4Margui, E. ; Floor, G. ; Hidalgo, M. ; Roman-Ross, G. ; Streli, Christina ; Queralt, I. Analytical Possibilities of Total Reflection X-Ray Spectrometry (TXRF) for Trace Selenium Determination in Soils and Leaching SolutionsPräsentation Presentation2011
5Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zamini, Shokufeh ; Zöger, N. Comparison of SR-TXRF Excitation-Detection Geometries for Samples with differing MatricesPräsentation Presentation2002
6Smolek, S. ; Nakazawa, T. ; Nakano, K. ; Tsuji, K. ; Streli, Christina ; Wobrauschek, Peter Comparsion and characterization of key parameters of two confocal micro-XRF spectrometersPräsentation Presentation2012
7Smolek, S. ; Streli, Christina ; Wobrauschek, Peter Confocal Micro-XRF Setup Optimized For Light Element AnalysisPräsentation Presentation2012
8Horntrich, C. ; Wobrauschek, Peter ; Montoya, V.M. ; Havrilla, G.J. ; Fittschen, U. ; Streli, Christina Determination and production of the ideal TXRF samplePräsentation Presentation2012
9Meirer, F. ; Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Horntrich, C. ; Zaitz, M.A. ; Falkenberg, G. Determination of the Oxidation State of Iron-Contaminations on Silicon Wafer Surfaces with K-Edge TXRF XanesPräsentation Presentation2007
10Roschger, A. ; Pemmer, B. ; Wobrauschek, Peter ; Streli, Christina ; Hofstätter, J. ; Roschger, Paul ; Klaushofer, K. ; Simon, R. Differential accumulation of lead in double-tidemarks in articular cartilage of osteoarthritic human jointsPräsentation Presentation2011
11Pemmer, B. ; Weixelbaumer, C. ; Fölser, M. ; Roschger, A. ; Hofstätter, J. ; Wobrauschek, Peter ; Windhager, R. ; Lang, S. ; Simon, R. ; Roschger, Paul ; Klaushofer, K. ; Streli, Christina Distribution of trace elements in human osteosarcoma - a malignant bone tumourPräsentation Presentation2012
12Zöger, N. ; Streli, Christina ; Meirer, F. ; Wobrauschek, Peter ; Smolek, S. ; Maderitsch, A. ; Roschger, Paul ; Hofstätter, J. ; Falkenberg, G. Elemental Imaging in Osteoarthritic Joint BonesPräsentation Presentation2007
13Wobrauschek, Peter Energy Dispersive XRF- detectorsPräsentation Presentation2007
14Streli, Christina Energy Dispersive XRF- sources and spectral modificationsPräsentation Presentation2007
15Herbst, R. ; Mantler, Michael Fundamental Parameter Method for Low Energy RegionPräsentation Presentation2002
16Meirer, F. ; Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zöger, N. Grazing-Exit-XRF ecperiments at HASYLAB beamline LPräsentation Presentation2008
17Wastl, A. ; Bogner, B. ; Kregsamer, Peter ; Wobrauschek, Peter ; Streli, Christina Gunshot residue investigations with TXRFPräsentation Presentation2011
18Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Streli, Christina ; Simon, R. ; Nutsch, A. Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing different sample shapesPräsentation Presentation2011
19Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Streli, Christina ; Simon, R. ; Nutsch, A. ; Knoerr, M. Influence of the excitation energy on absorption effects in TXRF analysisPräsentation Presentation2011
20Horntrich, C. ; Meirer, F. ; Streli, Christina ; Kregsamer, Peter ; Pepponi, Giancarlo ; Zöger, N. ; Wobrauschek, Peter Influence of the sample morphology on total reflection X-ray fluorescence analysisKonferenzbeitrag Inproceedings2008