Denver X-Ray Conference

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Description

Event name
Denver X-Ray Conference
 
Event type
Event for scientific audience
 
Start date
04-08-2008
End date
08-08-2008
 
Location
Denver Colorado
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Kregsamer, Peter

Results 1-6 of 6 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wastl, A. ; Bogner, B. ; Kregsamer, Peter ; Wobrauschek, Peter ; Streli, Christina Gunshot residue investigations with TXRFPräsentation Presentation2011
2Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Streli, Christina ; Simon, R. ; Nutsch, A. Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing different sample shapesPräsentation Presentation2011
3Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Streli, Christina ; Simon, R. ; Nutsch, A. ; Knoerr, M. Influence of the excitation energy on absorption effects in TXRF analysisPräsentation Presentation2011
4Horntrich, C. ; Meirer, F. ; Streli, Christina ; Kregsamer, Peter ; Pepponi, Giancarlo ; Zöger, N. ; Wobrauschek, Peter Influence of the sample morphology on total reflection X-ray fluorescence analysisKonferenzbeitrag Inproceedings2008
5Horntrich, C. ; Meirer, F. ; Streli, Christina ; Kregsamer, Peter ; Pepponi, Giancarlo ; Zöger, N. ; Wobrauschek, Peter Sample morphology: Influence on Total Reflection X-Ray Fluorescence AnalysisPräsentation Presentation2008
6Wobrauschek, Peter ; Streli, Christina ; Kregsamer, Peter ; Meirer, F. TXRF attachment Module modified for Analysis in VacuumPräsentation Presentation2007