IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Description

Event name
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
 
Event type
Event for scientific audience
 
Start date
27-06-2005
End date
01-07-2005
 
Location
Singapore
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Karner, Markus

Results 1-5 of 5 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Gös, Wolfgang ; Karner, Markus ; Sverdlov, Viktor ; Grasser, Tibor A Rigorous Model for Trapping and Detrapping in Thin Gate DielectricsKonferenzbeitrag Inproceedings2008
2Starkov, Ivan ; Tyaginov, S. E. ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor Analysis of Worst-Case Hot-Carrier Conditions for High Voltage Transistors Based on Full-Band Monte-Carlo SimulationsKonferenzbeitrag Inproceedings2010
3Tyaginov, S. E. ; Starkov, Ivan ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor Hot-Carrier Degradation Modeling Using Full-Band Monte-Carlo SimulationsKonferenzbeitrag Inproceedings2010
4Tyaginov, S. E. ; Starkov, I. A. ; Triebl, O. ; Karner, M. ; Kernstock, Ch. ; Jungemann, C. ; Enichlmair, H. ; Park, J.M. ; Grasser, T. Impact of gate oxide thickness variations on hot-carrier degradationKonferenzbeitrag Inproceedings2012
5Holzer, Stefan ; Hollauer, Christian ; Ceric, Hajdin ; Karner, Markus ; Grasser, Tibor ; Langer, Erasmus ; Selberherr, Siegfried Three-Dimensional Transient Interconnect Analysis With Regard to Mechanical StressKonferenzbeitrag Inproceedings2006