International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN)

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Description

Event name
International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN)
 
Event type
Event for scientific audience
 
Start date
27-05-2008
End date
30-05-2008
 
Location
Portland, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Rödiger, Peter
Author:  Waid, Simon

Results 1-3 of 3 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wanzenböck, Heinz D. ; Rödiger, Peter ; Waid, Simon ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Focused Beam Induced Etching - Making the Right Choice Between Ions and ElectronsPräsentation Presentation2011
2Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödiger, Peter ; Bertagnolli, Emmerich Focused Electron Beam Induced Etching - Advantages, Features & Limitations of FEBIE with ChlorineKonferenzbeitrag Inproceedings2015
3Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Waid, Simon ; Bertagnolli, Emmerich Removal of FIB-Induced Amorphization and Gallium Contamination by Focused-Electron-Beam-Induced-EtchingPräsentation Presentation2011