Gettering and Defect Engineering in Semiconductor Technology
Event name
Gettering and Defect Engineering in Semiconductor Technology
Start date
25-09-2011
End date
30-09-2011
Location
Loipersdorf, Austria
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Starkov, Ivan ; Tyaginov, S. E. ; Enichlmair, H. ; Park, Jong Mun ; Ceric, Hajdin ; Grasser, Tibor | Accurate Extraction of MOSFET Interface State Spatial Distribution from Charge Pumping Measurements | Konferenzbeitrag Inproceedings | 2011 | |
| 2 | Gös, Wolfgang ; Schanovsky, Franz ; Reisinger, H. ; Kaczer, Ben ; Grasser, Tibor | Bistable Defects as the Cause for NBTI and RTN | Konferenzbeitrag Inproceedings | 2011 |