22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Event name
22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Event type
Event for scientific audience
Start date
03-10-2011
End date
07-10-2011
Location
Bordeaux, France
Country
Event format Veranstaltungsformat
On Site
Results 1-3 of 3 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Orio, Roberto ; Ceric, Hajdin ; Selberherr, Siegfried | A Compact Model for Early Electromigration Failures of Copper Dual-Damascene Interconnects | Präsentation Presentation | 2011 | |
| 2 | Tyaginov, S. E. ; Starkov, Ivan ; Enichlmair, H. ; Jungemann, C. ; Park, Jong Mun ; Seebacher, E. ; Orio, Roberto ; Ceric, Hajdin ; Grasser, Tibor | An Analytical Approach for Physical Modeling of Hot-Carrier Induced Degradation | Konferenzbeitrag Inproceedings | 2011 | |
| 3 | Pobegen, G. ; Aichinger, T. ; Grasser, Tibor ; Nelhiebel, M. | Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETs | Konferenzbeitrag Inproceedings | 2011 |