22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

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Description

Event name
22nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
 
Event type
Event for scientific audience
 
Start date
03-10-2011
End date
07-10-2011
 
Location
Bordeaux, France
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen


Treffer 1-3 von 3 (Suchzeit: 0.001 Sekunden).

VorschauAutor_in(nen)TitelDokumenttypErscheinungs­datum
1Orio, Roberto ; Ceric, Hajdin ; Selberherr, Siegfried A Compact Model for Early Electromigration Failures of Copper Dual-Damascene InterconnectsPräsentation Presentation2011
2Tyaginov, S. E. ; Starkov, Ivan ; Enichlmair, H. ; Jungemann, C. ; Park, Jong Mun ; Seebacher, E. ; Orio, Roberto ; Ceric, Hajdin ; Grasser, Tibor An Analytical Approach for Physical Modeling of Hot-Carrier Induced DegradationKonferenzbeitrag Inproceedings2011
3Pobegen, G. ; Aichinger, T. ; Grasser, Tibor ; Nelhiebel, M. Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETsKonferenzbeitrag Inproceedings2011