IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Event name
IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Event type
Event for scientific audience
Start date
10-05-2015
End date
14-05-2015
Location
Hong Kong, China
Country
Event format Veranstaltungsformat
On Site
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Sharma, Prateek ; Tyaginov, Stanislav ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Bina, Markus ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor | Predictive and efficient modeling of hot-carrier degradation in nLDMOS devices | Konferenzbeitrag Inproceedings | 2015 |