TXRF conference 2009

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Description

Event name
TXRF conference 2009
 
Event type
Event for scientific audience
 
Start date
15-06-2009
End date
19-06-2009
 
Location
Goetheborg
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-10 of 10 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Posch, F. ; Fugger, Manfred ; Havrilla, G.J. ; Fittschen, U. Accreditation (EN ISO 17025) for an Atomika 8030W wafer analyzerPräsentation Presentation2009
2Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Borionetti, G. ; Kregsamer, Peter ; Streli, Christina ; Pepponi, Giancarlo Comparison of TXRF Systems from Si wafer surface analysis at different laboratories of ANNPräsentation Presentation2009
3Seneviratne, S. ; Waduge, V.A. ; Sanjeewani, S. ; Wobrauschek, Peter ; Streli, Christina Human Blood and Tissue analysis by TXRF with a new vacuum chamber WOBISTRAXPräsentation Presentation2009
4Horntrich, C. ; Meirer, F. ; Fittschen, U. ; Pepponi, Giancarlo ; Sasamori, S. ; Havrilla, G.J. ; Streli, Christina Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing picodroplets and microdropletsPräsentation Presentation2009
5Meirer, F. ; Pepponi, Giancarlo ; Streli, Christina ; Giubertoni, D. ; Wobrauschek, Peter ; Pianetta, P. Recent research about GI-XASPräsentation Presentation2009
6Meirer, F. ; Pepponi, Giancarlo ; Ingerle, D. ; Pahlke, S. ; Streli, Christina Retrofitting of an ATOMIKA 8010 TXRF Wafer-analyzer for GI-XRF AnalysisPräsentation Presentation2009
7Pepponi, Giancarlo ; Giubertoni, D. ; Bersani, M. ; Meirer, F. ; Streli, Christina Review of GIXRF applied to the quantification of ion implantsPräsentation Presentation2009
8Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter Si wafer analysis of light elements by TXRF ╨ chamber adaption to fit 6╥ and 8╥ wafersPräsentation Presentation2009
9Osan, J. ; Meirer, F. ; Török, S. ; Ingerle, D. ; Streli, Christina ; Pepponi, Giancarlo Speciation of copper and zinc in size-fractionated aerosol samples using TXRF-XANESPräsentation Presentation2009
10Ingerle, D. ; Meirer, F. ; Zöger, N. ; Pepponi, Giancarlo ; Giubertoni, D. ; Wobrauschek, Peter ; Streli, Christina Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf LayerPräsentation Presentation2009