ALTECH ECS Meeting

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Description

Event name
ALTECH ECS Meeting
 
Event type
Event for scientific audience
 
Start date
04-10-2009
End date
09-10-2009
 
Location
Wien
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-4 of 4 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Ingerle, D. ; Meirer, F. ; Zöger, N. ; Pepponi, Giancarlo ; Giubertoni, D. ; Wobrauschek, Peter ; Streli, Christina A GIXRF laboratory insrument for the characterization of ultra shallow implants and thin filmsPräsentation Presentation2009
2Beckhoff, B. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polignano, M.L. ; Codegoni, D. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Lazzeri, P. ; Gennaro, S. ; Kolbe, M. ; Müller, M. ; Kregsamer, Peter ; Posch, F. Assessing various analytical techniques with different lateral resolution by investigating spin-coated inorganic contamination on Si surfacesPräsentation Presentation2009
3Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Cazzini, E. ; Codegoni, D. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina Comparability of TXRF Systems at different laboratoriesPräsentation Presentation2009
4Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter Si wafer analysis of light elements by TXRFPräsentation Presentation2009