IEEE Transactions on Device and Materials Reliability

Title Titel

e-ISSN

1558-2574

ISSN

1530-4388

Publisher Herausgeber

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Publisher's Address Herausgeber Adresse

445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141

Listed in SCI Aufgelistet im SCI

Peer reviewed Begutachtet

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Subject: Reliability and Quality

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		Preview	Author(s)	Title	Type	Issue Date
	1		Ruch, Bernhard ; Pobegen, Gregor ; Rösch, Maximilian ; Vytla, Rajeev Krishna ; Grasser, Tibor	Charge Pumping of Low-Voltage Silicon Trench Powers MOSFETs	Artikel Article	2019
	2		Wu, Zhicheng ; Franco, Jacopo ; Vandooren, Anne ; Kaczer, Ben ; Roussel, Philippe ; Rzepa, Gerhard ; Grasser, Tibor ; Linten, Dimitri ; Groeseneken, Guido	Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration	Artikel Article	Jun-2019